Results

This SoC design incorporates a dedicated secondary processor to efficiently collect data from external devices. This secondary processor acquires, stores in its own memory, and then transmits the external device data to the primary memory, all without interrupting the primary processor, thereby enhancing the overall system's performance and responsiveness.

This patent describes an apparatus that provides a highly stable current reference by combining Proportional-to-Absolute Temperature (PTAT) and Complementary-to-Absolute Temperature (CTAT) currents. These currents are generated and precisely balanced to create a first-order temperature-compensated current reference, ensuring reliable and consistent performance of electronic systems across varying environmental temperatures.

This patent discloses a system for charging Unmanned Aerial Vehicles (UAVs) via electrified ground-level rails. A control circuit integrated within the UAV autonomously navigates it to the rail, precisely connects the UAV's charging contact with the rail's contact, coordinates the entire charging operation, and subsequently disengages the connection upon completion.

This patent describes a device and method for generating a highly stable current reference that significantly minimizes temperature-induced variations. It achieves this stability by combining Proportional-to-Absolute-Temperature (PTAT) and Complementary-to-Absolute-Temperature (CTAT) currents. First-order temperature variations are mitigated by carefully selecting impedance values, while more subtle second-order variations are addressed through modification of the current generation device's inversion coefficient. This results in a robust and precise current reference suitable for applications requiring consistent performance across a wide range of temperatures.

This patent describes a data storage system designed to enhance memory device reliability and performance. It achieves this by intelligently adjusting internal operating voltages – such as pass-through, bit line bias, or source line voltages – based on a determined "cross-temperature condition." This condition is established through real-time temperature profiling, specifically by measuring both the program (write) and read temperatures associated with virtual memory blocks. This dynamic voltage adaptation optimizes memory operation and mitigates temperature-related operational challenges, thereby improving data integrity and device longevity.