AI Patent Summary

Patent Document
#US6151238A
United States Patent 115
Abstract
An integrated circuit having a microcontroller, mask pro- grammed read only memory, functions such as clock oscillator, analog-to-digital converter, timers, etc., where each may be adjusted with a digital input to a desired calibration value. The digital input resulting in the desired calibration value being stored in a programmable fuse array.
AI Analysis & Synthesis
Synthesizing AI Summary...
Patent Classification & AI Product Mapping
Authoritative patent classification definitions mapped to real-world technology domains and commercial product categories.
CPC G06F11/00
Confidence: Medium
Official Definition
Error detection; Error correction; Monitoring
PHYSICS > COMPUTING OR CALCULATING; COUNTING > ELECTRIC DIGITAL DATA PROCESSING
AI Technology & Product Mapping
Technology Domain:
Embedded Systems & Microcontrollers
Product Category:
Microcontrollers & SoCs
Plain-English Summary:
Methods and hardware arrangements for detecting errors in data or system operation, correcting those errors, and monitoring system health or performance.
Relation to Claims:
The patent deals with calibrating various integrated circuit components using digital inputs stored in programmable fuse arrays, which relates to monitoring and adjusting system operating parameters to ensure reliable performance.
CPC H10W46/00
Confidence: Medium
Official Definition
Marks applied to devices, e.g. for alignment or identification
ELECTRICITY > SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR > GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
AI Technology & Product Mapping
Technology Domain:
Semiconductor Manufacturing & Packaging
Product Category:
Integrated Circuits
Plain-English Summary:
Physical or structural marks, codes, or features applied to semiconductor devices or microchips for identification, tracking, or precise alignment during manufacturing.
Relation to Claims:
The patent mentions using a programmable fuse array to store calibration values on an integrated circuit, which involves on-chip programmable elements that can also serve identification or configuration purposes.
CPC H10W46/401
Confidence: Medium
Official Definition
Marks applied to devices, e.g. for alignment or identification for identification or tracking
ELECTRICITY > SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR > GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
AI Technology & Product Mapping
Technology Domain:
Semiconductor Manufacturing & Packaging
Product Category:
Integrated Circuits
Plain-English Summary:
Specific structural features or codes applied to semiconductor devices primarily utilized for tracking individual chips and verifying their identity through production and lifecycle.
Relation to Claims:
Relates to the storage of specific digital data configurations (like fuse-based settings) within the integrated circuit that can uniquely configure or identify device calibration states.
CPC H10W46/403
Confidence: High
Official Definition
Marks applied to devices, e.g. for alignment or identification for identification or tracking for non-wireless electrical read out
ELECTRICITY > SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR > GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
AI Technology & Product Mapping
Technology Domain:
Non-Volatile Memory & Storage
Product Category:
Programmable Logic & Memory Arrays
Plain-English Summary:
Identification or tracking features on semiconductor devices that are read out using direct electrical connections rather than wireless or optical methods.
Relation to Claims:
Directly maps to the patent's use of a 'programmable fuse array' where calibration data is stored and retrieved via electrical signals rather than wireless transmission.
CPC H10W46/601
Confidence: High
Official Definition
Marks applied to devices, e.g. for alignment or identification for use after dicing
ELECTRICITY > SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR > GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
AI Technology & Product Mapping
Technology Domain:
Semiconductor Manufacturing & Packaging
Product Category:
Microcontrollers & SoCs
Plain-English Summary:
Identification, calibration, or tracking elements on semiconductor chips that remain functional and are utilized after the semiconductor wafer has been cut (diced) into individual integrated circuit dies.
Relation to Claims:
The integrated circuit described in the patent utilizes programmable fuse arrays for calibration values post-manufacturing, functioning within the packaged or diced individual microcontroller.