AI Patent Summary

Patent Document
#US5870409A
United States Patent 115
Abstract
A method is disclosed for testing a high speed microcon- troller fabricated on a semiconductor chip, and for testing relatively low speed functions of a liquid crystal display (LCD) module on the chip that drives an off-chip LCD for an external system to be controlled by the microcontroller with a plurality of discrete analog voltage levels for per- forming the LCD functions. Digital values are multiplexed in time slots of a test waveform to simulate in high speed digital format of a test mode the low speed timing, relative magnitude and functionality of analog voltage levels used to drive the LCD; A high speed driver is selectively coupled to a pin of the chip, to which the discrete analog voltage levels are normally applied at low speed to drive the LCD, and the test waveform is applied to the high speed driver. The digital values and timing that appear on the pin are then monitored as an indication of proper functionality of the LCD module. The high speed driver is switched out and the normal low speed LCD driver is switched back for return to an LCD user mode when the test mode is completed. Monitoring the pin with a digital tester allows verification that pin pulses in predetermined time slots indicate the corresponding analog voltage level is being applied at the proper time during normal operation of the LCD module, and digitally testing of continuity in an analog channel. A transistor normally employed on the chip for electrostatic discharge protection is activated to selectively couple the high speed driver to the pin for the high speed testing mode.
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Patent Classification & AI Product Mapping
Authoritative patent classification definitions mapped to real-world technology domains and commercial product categories.
CPC G09G3/00
Confidence: High
Official Definition
Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
PHYSICS > EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS > ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
AI Technology & Product Mapping
Technology Domain:
Display Drivers & Visual Indicators
Product Category:
LCD Display Modules & Controllers
Plain-English Summary:
Circuits and control systems designed specifically for operating flat-panel displays or other visual indicators that are not traditional cathode-ray tube (CRT) screens.
Relation to Claims:
The patent involves testing an on-chip liquid crystal display (LCD) module and its associated driver circuits that generate discrete analog voltage levels for controlling an external LCD.
CPC G09G3/006
Confidence: High
Official Definition
Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
PHYSICS > EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS > ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
AI Technology & Product Mapping
Technology Domain:
Display Testing & Quality Assurance
Product Category:
Automated Test Equipment & Display Drivers
Plain-English Summary:
Methods and hardware setups for electronically inspecting or testing display panels and their driving circuitry, such as LED or LCD screens.
Relation to Claims:
Directly maps to the patent's core method of testing low-speed LCD functions and display drivers on a microcontroller chip using high-speed digital test waveforms.
CPC G06F11/00
Confidence: High
Official Definition
Error detection; Error correction; Monitoring
PHYSICS > COMPUTING OR CALCULATING; COUNTING > ELECTRIC DIGITAL DATA PROCESSING
AI Technology & Product Mapping
Technology Domain:
Fault Tolerance & Hardware Monitoring
Product Category:
Semiconductor Test & Diagnostics
Plain-English Summary:
General techniques and systems for detecting errors, correcting data, or monitoring the health and performance of computing hardware and software.
Relation to Claims:
Provides the overarching classification for monitoring functionality, verifying pin pulses, and testing continuity in analog channels on a microcontroller.
CPC G06F11/22
Confidence: High
Official Definition
Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
PHYSICS > COMPUTING OR CALCULATING; COUNTING > ELECTRIC DIGITAL DATA PROCESSING
AI Technology & Product Mapping
Technology Domain:
Hardware Diagnostics & Testing
Product Category:
Microcontroller Test Modes
Plain-English Summary:
Methods for finding hardware defects in computers by running tests when the system is not in its normal active mode, such as during idle periods or start-up.
Relation to Claims:
Relates to the patent's 'test mode' where normal low-speed LCD operation is halted and a high-speed digital test waveform is applied to evaluate chip functionality.
CPC G06F11/2205
Confidence: High
Official Definition
Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
PHYSICS > COMPUTING OR CALCULATING; COUNTING > ELECTRIC DIGITAL DATA PROCESSING
AI Technology & Product Mapping
Technology Domain:
Embedded Diagnostics & Specialized Test Logic
Product Category:
Microcontroller Integrated Test Circuits
Plain-English Summary:
Hardware defect detection during idle or standby states using specialized testing circuitry tailored to the specific type of electronic component being evaluated.
Relation to Claims:
Matches the patent's specific implementation of using a high-speed driver coupled to a chip pin and activating an electrostatic discharge (ESD) protection transistor to test analog channels during a dedicated test mode.